Abstract
Cd-Te-In-oxide thin films were grown by Pulsed Laser Deposition (PLD) technique using CdTe powder embedded in a matrix of indium metallic as target. The films were deposited at different oxygen pressures (Po2) from 15 to 50 mTorr at substrate temperature of 420°C. Sheet resistance (Rsheet) and transmission spectrum were measured as a function of Po2. From measurements of optical transmission, the Photonic Flux Density (PFD) spectrum were obtained and the integral of these PFD for each film were evaluated between energy range of 1.5 eV and 2.4 eV for obtain the amount of photons that can be transferred across the film in this range of solar energy spectrum. These values were evaluated over the Rsheet to be used as a figure of merit. The best choice in our conditions was the films with Po2 =28.5 mTorr, where the figure of merit reaches the maximum value.
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