Abstract
ABSTRACT Crystals of the compound semiconductor Cd 0.55 Mn 0.45 Te were grown by modified Bridgeman technique. The resulting crystals were transparent, with a deep red color. There were no precipitates visible up to the 1.5µm resolution of the optical transmission microscopy system used. The electrical resistivity was measured to be 1x10 5 cm. The ability to grow large precipitate free crystals makes this system a good candidate for radiation detector elements. Electrical properties must be improved through better control of the concentration of electronically active impurities. Keywords: radiation, detector, semicond uctor, cadmium, manganese, tellurium 1. INTRODUCTION Cd 1-x Mn x Te (CMT), a diluted magnetic semico nductor, has been studied for decades 1-17 . These crystals demonstrate excellent performance as Faraday rotators and optical isolators 1, 2 , solar cells, lasers, and infrared 3 and magnetic field detectors. Recently, they were proposed as potential gamma-ray detectors
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