Abstract
The Cation Mass Spectrometer (CMS) should lead to high MCs x + useful yields by allowing to reach an optimum value of the stationary Cs surface concentration, which is known to be a very critical parameter in MCs x + analysis due to its strong influence on the probability of secondary Cs + ionisation. For the present work, variations of the Cs concentration were obtained by modifying the impact angle of the primary Cs + beam and by bombarding the sample simultaneously with Cs + and Ga + beams. Results show that these techniques allow to cover a large and continuous range of Cs surface concentrations and to reach an optimisation of the MCs x + useful yields (enhancements up to a factor 100 compared to Cameca 4f and 6f instruments) mainly due to work function conditions resulting in high Cs + ionisation probabilities.
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