Abstract
Pr-doped bismuth titanate (BixPryTi3O12: BPT) thin films with random orientation were fabricated on Pt/Ti/SiO2/Si substrates by rf magnetron sputtering technique, and the structures and Raman spectra of the films were investigated. XRD studies indicated that all of the BPT films consist of single phase of a bismuth-layered structure, showing a highly (117) oriented preferential growth with a minor fraction of (00l) orientation. For an increasing degree of Pr doping, Raman spectra studies revealed a substantial hardening of the vibration involving Bi atoms at the perovskite A site, whereas the Bi mode at the Bi2O2 layer is negligibly changed. From a comparison with a simple mass consideration, we identify a precise cation distribution, indicating a pronounced site selectivity of Pr ions for the A site for y ~ 1.2.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
