Abstract
The growth, structural and cathodoluminescent (CL) properties of 4 wt. hthinsp;[percent] europium-doped yttrium oxide (Eu:Y[sub 2]O[sub 3]) thin films are reported. The Eu:Y[sub 2]O[sub 3] films were grown [ital in situ] using a pulsed laser deposition technique. Our results show that Eu:Y[sub 2]O[sub 3] films can grow epitaxially on (100) hthinsp;LaAlO[sub 3] substrates under optimized deposition parameters. The epitaxial growth of Eu:Y[sub 2]O[sub 3] films on LaAlO[sub 3], which has a lattice mismatch of [approximately]60[percent], is explained by matching of the atom positions in the lattices of the film and the substrate after a rotation. CL data from these films are consistent with highly crystalline Eu:Y[sub 2]O[sub 3] films with an intense CL emission at 611 nm. [copyright] [ital 1999] [ital The American Physical Society]
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