Abstract

Orientation-patterned (OP) GaAs crystals are very promising for their use in nonlinear optical applications. In particular, mid-infrared and terahertz lasers can be generated by frequency conversion from shorter-wavelength sources. However, the quality of the crystals is crucial for high conversion efficiency, as the presence of defects with electrooptical signatures can contribute to optical losses. The study of these defects is a step toward the improvement of OP-GaAs crystals. We present here a spectroscopic cathodoluminescence study of the distribution of the main defects. Tentative relations between defects and the optical propagation losses are discussed.

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