Abstract
The cathodoluminescence mode of the Scanning Electron Microscope is used to evaluate local properties of the active layer of double-heterojunction lasers. The analysis of the Cathodoluminescence line-scans and spectra from cleaved laser surfaces, as a function of the external bias and of the incident beam current, give information about the interface quality, the internal efficiency and the local gain of stimulated emission. In order to make a quantitative interpretation of our experimental measurements, an analytical form of the tridimensional generation function, derived from a Monte-Carlo trajectory simulation, is used.
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