Abstract

Rare earth (RE) ion luminescence has long been used in laser and optical fiber communications technology. Bulk RE doped oxides were widely used in color phosphors for Cathode Ray Tubes. The wide band gap (WBG) semiconductors and insulators have been used for visible emission at 300 K from RE ions since the reports first by Zanata (Zanatta and Nunes 1998) for Er in silicon nitride (photoluminescence) and then shortly thereafter by Steckl (Steckl and Birkhahn 1998) for Er in GaN. The III-nitrides were emerging as Light Emitting Diodes and semiconductors at the time, and it was reported that the luminescence intensity of the RE ions was improved by a wide band gap host. Silicon (band gap ≈ 1.1 eV) is not suited for most visible RE ion emission. Glasses and oxides were used for the infra red (IR), especially for the emission from Er3+ ion at ~ 1.5 ┤m. In 1998, RE ion incorporation into a crystalline host was often accomplished by ion implantation at low atomic concentrations, or by in situ doping (again with low atomic percentages) of the RE ions. It was believed that the quality of the host lattice was essential to the RE luminescence. However, Zanata and Nunes observed green room temperature luminescence from an Er-doped silicon nitride film deposited by reactive sputtering in nitrogen. Visible emission was observed with an estimated 10 at. % dopant concentration in an amorphous material. Both the amorphous and crystalline hosts discovered by the Zanata and Steckl groups set in motion the (enduring) pursuit of practical visible light emission devices using RE ions in wide band gap materials.

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