Abstract
AbstractWe report on the characterization of ternary Zn1–xCoxO alloy crystalline films grown by electrodeposition onto FTO‐coated substrates. The Zn1–xCoxO films have hexagonal wurtzite structure as shown by X‐ray diffraction measurements. The Co incorporation into the ZnO lattice is confirmed by the presence of absorption peaks assigned to Co in trigonal crystal field. X‐ray photoemission spectroscopy indicates that as‐grown films have a considerable concentration of not‐fully oxidized metallic Co in the surface that correlates with the O concentration in the surface. Finally, Raman measurements of as‐grown films indicate that they are polycrystalline with grains of nanometric size showing short‐range order but no long‐range order. The Raman spectra show no trace of first‐order phonons and resemble the one‐and two‐phonon density of states of ZnO (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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