Abstract
We have investigated the effects of low fluence (<1014 cm−2 ) 63 MeV H+ and 65 MeV He2+ irradiation of prototype thin films of YBa2Cu3O7−δ produced by a plasma-arc spray technique. The observed changes in the resistance versus temperature behavior are much more dramatic than that observed for films produced by other techniques and resembles qualitatively a bond percolation threshold. The radiation sensitivity of these plasma-arc spray films is concluded to be due to poor intergranular characteristics. This information is being used to modify the processing steps to improve the properties of films produced by this technique.
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