Abstract
We present experimental evidence for the Casimir effect within critical films of binary liquid mixtures possessing opposite boundary conditions (+-) by studying the thickness of these vapor-adsorbed films on a silicon wafer as a function of temperature near the critical temperature. Our results for two different critical mixtures demonstrate that the critical Casimir pressure scaling function vartheta(+-)(y) scales with y=L/xi, where L is the equilibrium film thickness and xi is the bulk correlation length. Additionally, on approaching the critical temperature T(c) an increase in the film thickness L is observed, implying that the sign of the universal Casimir amplitude Delta(+-)=vartheta(+-)(0)/2 at T(c) is positive, consistent with theoretical predictions. However, the magnitude of the Casimir amplitude that we measure is approximately two orders of magnitude smaller than that given by prevailing theories. In the two-phase region of the liquid mixture, preliminary evidence suggests that the adsorbed film undergoes a surface phase transition from a film near the critical composition at T less, similarT(c) to a film near one of the bulk phases at T<<T(c). This low temperature film composition most likely corresponds to the bulk phase rich in the component that preferentially adsorbs at the silicon surface.
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More From: Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
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