Abstract

In the field of semiconductor production and manufacturing, the detection of defects on lead frame surfaces is a vital process. This process plays a key role in ensuring the quality of the final product. Using high-resolution detection images to detect multi-scale tiny surface defects is necessary, but this amplifies the impact of environmental noise. Therefore, suppressing both the false negative rate and false positive rate in practical detection scenarios is a challenge that needs to be overcome. Current research on lead frame surface defect detection is mostly concentrated on the downloaded standard original images, which limits its application in actual production lines. This paper presents a cascaded detection method for surface defects of lead frame based on high-resolution detection images. Firstly, this study presents the unit cell extraction module to convert the detection object from high-resolution image to hundreds of unit cells. The proposed module can handle real-time detection images in the production pipeline, especially addressing situations such as lighting imbalances and tilted detection images. Subsequently, this study proposes a lead frame surface defect detection network (LDD-net), which takes unit cells as inputs and can effectively detect multi-scale defects. Compared to other models, LDD-net can effectively capture the features of subtle defects. Additionally, this paper introduces the deviation in the central width direction into the CIoU localization loss, enhancing the accuracy of defect localization in LDD-net. The data set is constructed using the machine vision detection system and conducts training and testing. Specifically, experiments of LDD-net on the data set obtained 85.01% mean average precision (mAP) and 37 ms of inference time, respectively. The detection accuracy exceeds 95%, and the false negative rate can be controlled below 6%. This approach will assist manual monitoring personnel in evaluating product quality.

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