Abstract
Based on the Fowler–Nordheim tunneling theory at high electric fields, a model of carriers recombination in organic double-layer light-emitting diodes is presented in this paper. We provide the formula expressions of the carriers recombination current density as function of factors such as the injection barrier, anodic electric field and thickness ratio of cathodic layer to anodic layer, and discuss the influence of these factors on the recombination current density and recombination efficiency. Being in accord with the experiments very well, we find it is reasonable to elucidate the controlling role of electric field on recombination region.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
