Abstract
The mode-combs of two lasers with synchronized repetition rate, a femtosecond Ti:sapphire- and a picosecond Nd:YVO 4-laser, are characterized by measuring the carrier-envelope offset (CEO) frequencies of the lasers using a second/third harmonic interference scheme and direct interference in the overlap region, respectively. This method enables the measurement of the CEO frequency of narrow band lasers, here a picosecond Nd:YVO 4 laser. Together with efficient nonlinear frequency conversion schemes, high power picosecond lasers may be used to extent optical frequency metrology from a Ti:sapphire standard to the UV and near IR spectral regions.
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