Abstract

The dark current density–voltage characteristics of Au/p-ZnPc/p-Si device at different temperatures ranging from 302 to 364 K have been investigated. Results showed a rectification behavior. At low forward bias, the current density was found to limited by the thermionic emission of holes from p-Si over the organic/inorganic barrier in the ZnPc thin film, while at high voltages, space charge limited current mechanism dominated by a single trapping level. Junction parameters such as, built-in potential, V bi, carrier concentration, N, the width of the depletion layer, W, were obtained from the C– V measurements. The current density–voltage characteristics under light illumination provided by tungsten lamp (200 W/m 2) gives values of 0.44 V, 31.25 A/m 2, 0.335% and 2.3% for the open circuit voltage, V oc, the short circuit current density, J sc, the fill factor, FF, and conversion efficiency, η, respectively.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call