Abstract
Introducing a carrier into a fringe pattern makes the phase retrieval problem well-posed, and has become one of the pillar techniques in optical metrology. The carrier fringe pattern analysis for high-accuracy phase retrieval is hence important, for which, many well-known methods have been developed, such as the Fourier transform method, the windowed Fourier transform based methods (the windowed Fourier filtering and the windowed Fourier ridges), the spatial carrier phase-shifting method, and the sampling moiré method. These methods were developed independently and seemingly different. The purpose of this paper is to reveal the close relationships between them, and to connect these methods into a tight-knit methodology family.
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