Abstract

In high-purity GaN grown by hydride vapor phase epitaxy, the commonly observed yellow luminescence (YL) band gives way to a green luminescence (GL) band at high excitation intensity. We propose that the GL band with a maximum at 2.4 eV is caused by transitions of electrons from the conduction band to the 0/+ level of the isolated ${\mathrm{C}}_{\mathrm{N}}$ defect. The YL band, related to transitions via the \ensuremath{-}/0 level of the same defect, has a maximum at 2.1 eV and can be observed only for some high-purity samples. However, in less pure GaN samples, where no GL band is observed, another YL band with a maximum at 2.2 eV dominates the photoluminescence spectrum. The latter is attributed to the ${\mathrm{C}}_{\mathrm{N}}{\mathrm{O}}_{\mathrm{N}}$ complex.

Highlights

  • Gallium nitride (GaN) is a promising material for high-power/high-frequency electronics [1,2,3,4]

  • The yellow luminescence (YL) band in GaN grown by metal-organic chemical vapor deposition (MOCVD) has a maximum at 2.2 eV (Figs. 2 and 3)

  • In conductive n-type GaN, the YL band intensity begins to saturate at excitation intensities Pexc > 10−5 W/cm2 (Fig. 2)

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Summary

Introduction

Gallium nitride (GaN) is a promising material for high-power/high-frequency electronics [1,2,3,4]. The YL and GL bands were attributed to transitions of electrons from the conduction band to the 2−/− and −/0 transition levels, respectively, of the gallium vacancy-oxygen (VGaON) complex [6]. The exponential decay of the GL band at low temperatures was explained with the assumption that the GL band is caused by transitions of electrons from an excited state, located very close to the conduction band minimum (CBM), to the −/0 level of the VGaON acceptor [5]. Such an assumption is not well justified. A revision of the attribution for the GL band in GaN is needed

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