Abstract
Experiments have been performed to compare secondary ion emission from polymer substrates under kiloelectronvolt ion (secondary ion mass spectrometry, SIMS) and megaelectronvolt ion (plasma desorption mass spectrometry, PDMS) bombardment. The yield of carbon cluster ions has been determined for different polymers. A positive PDMS spectrum of poly(vinylidene fluoride) showing even-numbered carbon clusters to C{sub 200} is presented. The emission of these carbon cluster ions is explained by the strong degradation of the polymer under megaelectronvolt ion bombardment. This is discussed in comparison with the results in SIMS and laser mass spectrometry.
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