Abstract
The frequency dependence of the resistance of thin films of lead sulfide and tellurium is analyzed in terms of distributed capacitance and intercrystallite capacitance. It is shown that for some films of either material the observed behavior can be explained in terms of distributed capacitance alone, but that others require a combination of the two types of capacitance. An expected correlation between photoconductivity and the presence of intercrystallite capacitance was not found in these experiments.
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