Abstract
Photodarkening (PD) effect in Cu-doped As-Se films with various structures has been investigated to see whether the copper can completely suppress the PD effect in the As-Se films. Under the illumination of 655 nm light, it was found that, the minimum PD can be found in the homogeneously doped As-Se films. This is in sharp contrast with the previous results where it was claimed that PD can be completely suppressed in Cu-doped As2Se3 bulk glasses. Further experiments in the films illuminated by the light with different power elucidate that PD in the Cu-doped As2Se3 films is sensitive to photon energy and power level used in the experiments.
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