Abstract

In this work, a Cu–Cr–Ag–Mg–Sn alloy was developed assisted by a CALPHAD technique, by which a suitable chemical composition (Cu-0.5Cr-0.1Ag-0.05Mg-0.05Sn) and processing parameters were efficiently designed. The achieved alloy exhibited yield strength and conductivity values of 642 MPa and 74.2% IACS, respectively, which greatly surpassed the commercial C18150 alloy. Transmission electron microscopy observation demonstrated that such a good comprehensive performance was attributed to numerous nano-scale Cr precipitates that possessed a strong coherent relationship with the Cu matrix. Further microstructure characterizations demonstrated that these beneficial Cr precipitates were associated with subgrain boundaries in the alloy introduced by a cold-rolling→short-time secondary solid solution. Atom probe tomography analysis demonstrated that Sn atoms that readily attached to the surfaces of Cr precipitates.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call