Abstract

Research Article| July 01, 2004 California Creepmeters Roger Bilham; Roger Bilham CIRES & Department of Geological Sciences University of Colorado Boulder, CO 80309-0399 roger.bitham@colorado.edu Search for other works by this author on: GSW Google Scholar Naia Suszek; Naia Suszek CIRES & Department of Geological Sciences University of Colorado Boulder, CO 80309-0399 roger.bitham@colorado.edu Search for other works by this author on: GSW Google Scholar Sean Pinkney Sean Pinkney CIRES & Department of Geological Sciences University of Colorado Boulder, CO 80309-0399 roger.bitham@colorado.edu Search for other works by this author on: GSW Google Scholar Seismological Research Letters (2004) 75 (4): 481–492. https://doi.org/10.1785/gssrl.75.4.481 Article history first online: 09 Mar 2017 Cite View This Citation Add to Citation Manager Share Icon Share Facebook Twitter LinkedIn MailTo Tools Icon Tools Get Permissions Search Site Citation Roger Bilham, Naia Suszek, Sean Pinkney; California Creepmeters. Seismological Research Letters 2004;; 75 (4): 481–492. doi: https://doi.org/10.1785/gssrl.75.4.481 Download citation file: Ris (Zotero) Refmanager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentBy SocietySeismological Research Letters Search Advanced Search A handful of faults in California manifest some form of surface creep: afterslip, episodic slip, steady slip, or triggered slip. Creep can be considered a proxy for shear strain applied to a fault, although its rate is sensitive also to fault-normal stresses, variations in the frictional properties of the near-surface fault, and in some locations to variations in near-surface moisture content. Creepmeters afford a view of fault activity with micron precision, at rates of up to 5 mm/minute, though creep rates on most California faults are typically less than several millimeters per year. This article summarizes the current status of... You do not have access to this content, please speak to your institutional administrator if you feel you should have access.

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