Abstract
The feasibility of using a diffraction grating manufactured by laser photoinduced etching of the (001) surface of single-crystal InP and monatomic steps on a highly-oriented (0001) surface of pyrolytic graphite as reference samples for calibration of scanning near-field microscopes operating in the shear-force (quasifriction) mode is demonstrated.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have