Abstract
Diode to diode spacing is critical for high resolution print quality in electrophotographic printing. Small errors in spacing, smaller than the accuracy of current measurement equipment, can create beats in halftone screens leading to pronounced banding defects. High accuracy measurement techniques using mathematical analysis of lower resolution data have been reported. These techniques are contingent on accurate calibration of spatial quantum efficiency of measurement cameras which in turn depend on light/bright field irradiance calibration. An inexpensive but uniform light source design and the resulting data for light field calibration are described. Dark field calibration is also discussed, but has a smaller impact on the diode to diode spacing measurement.
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