Abstract

The response of sensitive detectors, CR-39 and ZnP-glass, for 350 MeV 90Zr ions, has been studied. Bulk and track-etch parameters have been evaluated by successive etching. Calibration of the two detectors has been done by correlating the measured track-etch rate (VT) with the residual range and total energy-loss rate. A linear correlation has been observed in both cases. Track registration threshold values of 4.45 MeV mg-1 cm2 for CR-39 and 12.50 MeV mg-1 cm2 for ZnP-glass have been obtained.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.