Abstract
Abstract We studied the track response of CR-39 plastic nuclear track detectors (PNTD) for low ( 100 MeV/n) energy heavy ions using the atomic force microscope (AFM). CR-39 PNTD was exposed to several heavy ion beams of different energy at HIMAC (Heavy Ion Medical Accelerator in Chiba). For AFM measurement, the amount of bulk etch was controlled to be ∼2 μm in order to avoid etching away of short range tracks. The response data obtained by AFM for ∼2 μm bulk etch was in good agreement with data obtained by the conventional optical microscope analysis for larger bulk etch. The response data from low energy beams (stopping near the surface) was also consistent with the data from high energy beams (penetrating the detector) as a function of REL (restricted energy loss) with the δ-ray cut off energy of ω 0 = 200 eV. We experimentally verified that REL ( ω 0 = 200 eV) gives a universal function for wide energy range in CR-39 PNTD. This work has been done as part of a basic study in the measurement of secondary short range tracks produced by target fragmentation reactions in proton cancer therapy fields.
Published Version
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