Calibration of a time-resolving spectrometer in the 100–800 eV spectral region (abstract)

Abstract

We are calibrating a new time-resolving x-ray spectrometer used to diagnose z-pinch driven hohlraums at the Saturn Facility. The instrument uses a 5000 lines/mm transmission grating dispersing element and has an array of silicon photodiodes and a gated microchannel-plate detector for recording spectra. The diodes are located every 50 eV from 100 to 850 eV (E/ΔE=10) and have subnanosecond temporal and near-theoretical quantum efficiency. The microchannel-plate detector uses a 6.25 Ω gold stripline to record both a 5 ns frame of continuous spectrum and shadows of each silicon diode in the spectrum. This poster describes measurements of the spectral sensitivity of the instrument, including relative grating order efficiencies, microchannel-plate detector efficiency, and absolute sensitivity and time response of the silicon diodes.