Abstract
An accuracy and precision of better than 10% each can be achieved with PIXE analysis, with both thin and thick samples. Measures we took to obtain these values for routine analyses in the Marburg PIXE system are discussed. The advantages of an experimental calibration procedure, using thin evaporated standard foils, over the “absolute” method of employing X-ray production cross sections are outlined. The importance of X-ray line intensity ratios, even of weak transitions, for the accurate analysis of interfering elements of low mass content is demonstrated for the Se K α-Pb L ηline overlap. Matrix effects including secondary excitation can be corrected for very well without degrading accuracy under certain conditions.
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