Abstract
Abstract An analytical perturbation method is discussed for the calculation of electrostatic fields, which simplifies considerably the design of electron-optical elements of spectrometers for a simultaneous angle and energy analysis of wide electron beams––polar-toroidal condensers and conical lenses. Comparison of this method with numerical computation demonstrates the high accuracy of the anlytical field representation. Methods for the elimination of beam deflection in conical lenses are proposed.
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