Abstract
ABSTRACT Expressions for X-ray fluorescence spectroscopy described in a previous paper, were extended for the calculation of the fluorescence intensity of a thin specimen, providing a detector count rate with a precision of better than 0.2%. The results are presented in the form of δ(ζ1η1 − ζ2η2) where η1 and η2 are the standard functions common to all cylindrical geometry systems of any size, δ, and where ζ1, and ζ2 are user calculable coefficients.
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