Calculation of the pure surface composition of the binary alloy according to XPS data obtained after the alloy surface contact with air

Abstract

An XPS technique to determine the surface concentrations of the components of binary alloy prepared in an ultra-high vacuum chamber and subjected to the contact with the air is proposed. The technique takes into account the effect of the adsorption film on the sample surface, which distorts the photoelectron current of the analytical XPS lines. The potential of the technique is demonstrated by the example of studying Sn-Pb system alloys.