Abstract
The intensities of vacuum-ultraviolet emission of excimers in a krypton-xenon mixture are calculated in terms of the homogeneous model of a barrier discharge. The mechanisms of the formation of excimer molecules are investigated at different xenon concentrations. The obtained dependences of the efficiency of vacuum-ultraviolet emission on the reduced electric field E/N (where E is the electric field strength and N is the particle concentration of the gas) and the xenon content exhibit a plateau and a subsequent steep decline. The efficiency of vacuum-ultraviolet emission reaches a maximum at the plateau when the xenon content δ is approximately equal to 40%. The concentrations of xenon excimers can be as high as 1014–1015 cm−3. This is comparable to the concentrations in a barrier discharge in pure xenon.
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