Abstract

The base current density JB is an important parameter in determining the common-emitter current gain β of heterojunction bipolar transistors (HBTs). To develop an analytical β model with which a circuit designer can quickly estimate the current gain in a HBT, it is also important to identify the dominant component of JB so that minimum computations are required. Based on heterojunction device physics, the three components of JB have been calculated, namely, the recombination current density in the base JRB, the recombination current density in the space-charge region JSCR, and the injection current density from the base to the emitter JRE, and have determined their relative importance to JB for abrupt AlGaAs/GaAs and InAlAs/InGaAs HBTs under normal bias conditions. It is found that relative importance of the three current densities depends strongly on the bias condition, strongly on the density of states NtI at the emitter-base heterointerface, but weakly on the density of trapping states NtB in the bulk of the emitter-base space-charge region. Also, JB is relatively insensitive to device makeup such as doping concentration and layer thickness. Depending on NtI and on the bias condition, either JSCR or JRE is the dominant component for AlGaAs/GaAs HBTs and either JSCR or JRB is the dominant component for InAlAs/InGaAs HBTs. Effects of base and heterojunction grading on the present findings are also addressed.

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