Abstract

Mueller matrix is a useful tool for analyzing polarization characteristics in a wealth of research fields. With Mueller matrix, the modulation effects of samples on polarization could be quantitatively analyzed and discussed. In this paper, all elements in the Mueller matrix are calculated when the lights scatter from one dimensional randomly rough surfaces at different conditions with Kirchhoff approximation method which owns high accuracy and fast calculation speed. Besides, theoretical analysis of the light scattering from randomly rough dielectrics and metal surfaces is also proposed in this paper. Moreover, with both theoretical analysis and numerical simulations, we have explained the variations of all elements in Mueller matrix, more importantly, m<sub>34</sub> is highly focused which is quite a significant mark in both randomly rough dielectric and metal surfaces. To our best knowledge, it is the first time this obvious difference is both analyzed and discussed via both theoretical analysis and numerical calculation, and is successfully explained via phase difference between incident and reflective waves. According to the analysis, more information of the target could be obtained in order to determine the characteristics of the target. The paper will be an important reference for polarization imaging in laser radar and remote sensing, etc.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.