Abstract
The extension of the plate diagram method to off-axis systems makes it possible to calculate the field curvature of the system under study only partially, since the system defined as the reference system contributes to that aberration. In this work the field curvature introduced by the reference system is calculated as a function of the variables which describe the diagram corresponding to the system being studied. Thus, the generalization of the method allows all the existing aberrations to be known.
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