Abstract
Fractal geometry is widely used to characterize machined surfaces and fractal dimension is the most important parameter. This work studies the wavelet-based method and its accuracy to extract fractal dimensions. Surface profiles are generated by Weierstrass-Mandelbrot (WM) function and prescribed wavelet coefficients (PWC) method. The orthonormal basis, vanishing moment and level of discrete wavelet transform are analyzed to calculate the proper fractal dimension. The standard reference surfaces are measured to verify the wavelet-based method.
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