Abstract
This paper describes an improved method for obtaining the electron range values, R opt, R 50, R 50e, R ex and R p, which are used to characterize the shape of depth–dose distribution curves. This new procedure employs standard mathematical principles that can be applied to depth–dose data in order to more precisely determine these range values. It is common practice to analyze depth–dose curves manually to obtain these quantities, while the new method uses mathematical curve fitting and analytical techniques to determine the range values more accurately and more consistently. The example presented in this paper utilizes the 10 MeV depth–dose data for polystyrene, which were obtained by Monte Carlo calculation for the latest revision of ISO/ASTM 51649, Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies between 300 keV and 25 MeV.
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