Abstract
1. The crystallographic problem A general feature of materials built of layers is the variety of the stacks; the phyllosilicate family is a good example of such diversity. In their crystals, the layers can be translated in different ways and rotated, and mixed layering can occur. As a consequence, depending on the nature and proportion of stacking faults, the reflections are more or less broadened and/or shifted in comparison with those expected for ordered crystals. The determination of the stacking parameters then requires a modelling of the experimental diffraction patterns. Concerning the mixed-layering problem, a theoretical description of the diffraction was first presented by Kakinoki & Komura (1965). The general formalism for the diffraction by crystals containing translational or rotational stacking faults was described by
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