Abstract

Thin films and micro- and nanostructures Zinc Oxide (ZnO) are promising candidates for novel application in solar cells, sensors, emerging transistors and optoelectronic devices. The thin films prepared via dip-coating were heat treated at calcination temperatures from 400 °C to 600 °C. Scanning electron microscope (SEM), atomic force microscope (AFM) and ultraviolet visible spectroscopic (UV-vis) analysis has been conducted on ZnO thin films in order to observe the calcination effect. The results showed that, the grain size and surface roughness improved while the optical transmittance diminished with increasing the calcinations temperature.

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