Abstract
Tin (Sn) adsorption on Si(100) surface has been studied by scanning tunneling microscopy (STM) and co-axial impact collision ion scattering spectroscopy (CAICISS). The c(8×4) and (5×1) phases were analyzed to reveal their atomic structure. It has been confirmed that the c(8×4) structure consists of buckled Sn dimers. The (5×1) structure has been found to be partially irregular along (5×1) rows and to consist of double Sn layer. The Sn atoms in the first layer are undimerised while those in second layer form asymmetric dimers.
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