Abstract
The vertical Bridgman method is used for the growth of single-doped CsI(Tl) and CsI(Tl:Ca) crystals, which has been evaluated for feasible applications in X-ray imaging and radiation detection. The powder XRD technique study reveals a single-crystalline phase of the grown crystal. The emission spectra show a broad emission band with a maximum of 540 nm under X-ray excitation, along with the characteristic emissions that arose from the Tl+ intra-center transition. The scintillation qualities of the grown crystal were studied via the pulse height spectra, scintillation light yield, energy resolution, and scintillation decay time. Pulse shape discrimination (PSD) was investigated under γ-rays and α-particles excitation sources. Moreover, the X-ray imaging application was investigated by an X-ray synchrotron at the Synchrotron Light Research Institute to study the performance of the grown crystal. These preliminary investigations suggest that the grown CsI(Tl:Ca) crystal can be one of the promising crystals for γ- and X-ray detecting applications.
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