By-Emitter Emulation of the Degradation of a Calibrated 975 nm Tapered Laser Bar Using a Laser Diode Simulation/Emulation Tool

Abstract

In this paper, Barlase has been taken a step further by emulating the degradation processes in high power semiconductor laser bars to further deepen the understanding of the behaviour of laser bars. In publications elsewhere where Barlase was used, investigations were done using hypothetical laser bars to emulate various degradation processes commonly found in the operations of lasers. In this paper however, the emulation of a real laser bar is being investigated to compare experimental results to the emulated results to establish a correlation between them. The results established show a close matching between the experimental and the emulated results but the levels of change were not similar. The reason for this can be attributed to the thermal properties used in Barlase and that the consideration of a global thermal solver will be necessary to improve upon the mismatch between the experimental and emulated results.