Abstract
BIST structures for on-chip generation of random, exhaustive and deterministic test patterns have been discussed in the paper. Iso-morphism between maximal length LFSR and exhaustive CA has been established and the pseudorandomness properties of CAs in terms of well-suited autocorrelation functions have been investigated. Owing to the regularity in interconnection structure, additive group CA (cellular automata) offers advantages over LFSR. A method of covering deterministic test set by a counter-based scheme and its optimisation based on AT2 complexity has been discussed.
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