Abstract
Descriptions are given of the most significant types of defects and their implication on delay effects and overcurrents for different classes of CMOS circuits. Delay fault testing and built-in current testing have emerged as the most promising methods in CMOS testing for high fault coverage. Based on different types of transistor circuits, an analysis is performed to investigate the fault coverage potential of both methods for transistor faults and bridging faults. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
