Abstract
ASTRACT Built in self-test (BIST) is a technique or a method which allow the circuit to test itself. BIST increases the controllability and observability of integrated circuit therefore it is easier to apply inputs and then detect faults from it [11]. BIST also decreases the time of testing integrated circuits & gives very high fault coverage. Therefore in many ways BIST help us in detecting fault in integrated circuits. This paper presents an efficient fault detection algorithm for 4 × 4 signed & unsigned multiplier in field programmable gate array (FPGA). These techniques were successfully applied on booth, braun & unsigned array multipliers.
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