Abstract

Buffer-layer dependences of dead-layer thickness, saturation magnetization ( $M_{\mathrm {s}})$ , and interface magnetic anisotropy ( $K_{\mathrm {s}})$ were systematically investigated for Co2Fe0.4Mn0.6Si (CFMS) Heusler alloy ultrathin films with Pd, Ru, and Cr buffer layers. Perpendicular magnetization was only achieved in 0.6 and 0.8 nm-thick CFMS ultrathin films deposited on Pd buffer layer and annealed at 400 °C. At the optimum annealing temperature of 400 °C, $K_{\mathrm {{s}}}$ of 1.2 erg/cm2 was obtained for the Pd buffer layer, which was 3–6 times larger than those for Ru and Cr buffer layers. The difference in $K_{\mathrm {{s}}}$ probably originates from the interdiffusion and different crystallized compounds at the interface between Pd (Ru, Cr) and CFMS layers.

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