Abstract

The critical buckling load of a functionally-graded simply-supported beam with partially delaminated piezoelectric layers is discussed. The governing equations of motion are derived using two different, i.e. Euler–Bernoulli and Timoshenko beam theories, and the buckling load was evaluated from the exact solution to the corresponding eigenvalue equation. The equations were simplified to some extent by shifting the coordinate origin such that there is zero bending-extension coupling. Effects induced by the delaminated length, asymmetry, piezoelectric thickness, voltage, and the functionally graded materials (FGMs) volume fraction are evaluated. The validity of results and the invoked assumptions were successfully verified with existing results and finite element calculations. There is some difference between the analytical buckling load and that calculated with the finite element method (FEM), proven small in amount but predictable in terms of the piezoelectric thickness. Further, a general formula is derived to evaluate the dimensionless critical buckling load with the parameters obtained from regression analysis of the solution that can be utilized for all cases where the materials are not far different in their mechanical properties. The results can be utilized as benchmark design tool.

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