Broadband transmission properties of graphene-dielectric interfaces

Abstract

Abstract We report the transmission and reflection properties of graphene-SiO2, graphene-Si interface with normal incidence. We analyze the real and imaginary parts of Graphene in a broad wavelength range 0.5–4.0 µm and use both Fresnel theory and Finite-difference Time-domain (FDTD) numerical simulations to calculate the transmittance and reflectance. The theoretical and numerical results show that the transmission and reflection on the interfaces mentioned above have a anormal phenomenon. The physical mechanism for anormal phenomenon is analyzed. Between 100 nm and 500 nm wavelength, the transmission and the reflection of graphene-SiO2 layer and graphene-Si layer have some sharp change. When the wavelength is more than 500 nm, the transmission and reflection of the two layers mentioned above have been a regular curve without sharp change. The transmission and reflection of the graphene layers is the order of 1.0, zero, respectively. These findings can pave new way for the active optoelectronic devices.