Abstract

Optical nonlinear response and its dynamics of wide-bandgap materials are key to realizing integrated nonlinear photonics and photonic circuit applications. However, those applications are severely limited by the unavailability of both dispersion and dynamics of nonlinear refraction (NLR) via conventional measurements. In this work, the broadband NLR dynamics with extremely high sensitivity (λ/1000) can be obtained from absorption spectroscopy in GaN:C using the refraction-related interference model. Both the absorption and refraction kinetics are found to be significantly modulated by the C-related defects. Especially, we demonstrate that the refractive index change Δn of GaN:C is negative and can be used to realize all-optical switching applications owing to the large NLR and ultrafast switching time. The NLR under different non-equilibrium carrier distributions originates from the capture of electrons by CN+ defect state, while the absorption modulation originates from the excitation of tri-carbon defects. We believe that this work provides a better understanding of the GaN:C nonlinear properties and an effective solution to broadband NLR dynamics of transparent thin films or heterostructure materials.

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