Abstract
Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. This is made possible by the adaptation of a birefringence-based ultrastable interferometer for infrared femtosecond pulses. Since we measure the interference with an EUV-sensitive CCD camera, this enables a wide range of spatially and spectrally resolved measurements at extreme ultraviolet wavelengths. We demonstrate the capabilities of this technique by performing wavelength-resolved high-resolution coherent diffractive imaging and by measuring the spatially resolved spectral absorption of a thin structured titanium film.
Highlights
Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm
Due to the excellent spatial coherence of the generated light, High-harmonic generation (HHG)-sources are an ideal candidate for interferometry at these wavelengths
It has already been shown that high-harmonic interferometry is a useful tool to determine various source properties, such as spectra and wavefronts of the individual high-harmonics
Summary
Using a pair of phase-locked high-harmonic generation sources, we demonstrate Fourier transform interferometry at extreme-ultraviolet (EUV) wavelengths between 17 and 55 nm. High-harmonic generation (HHG) is a well-known source of broad extreme ultraviolet (EUV) and soft-X-ray spectra. Due to the excellent spatial coherence of the generated light, HHG-sources are an ideal candidate for interferometry at these wavelengths.
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